Classification
| Heading/Sub | Stat Suffix | Article Description | Unit of Qty | General | Special | Column 2 |
|---|---|---|---|---|---|---|
| 90.31 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | — | — | — | ||
| ..4 | ||||||
| ..4.1. | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | — | 50% | ||
| 40 | For wafers | — | — | — |
Governing Provision
9031.41.00
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
Governed by 9031.41.00 (inherited_rate_bearing_ancestor)
Additional Duties & Quota
- Additional Duties
- None
- Quota
- None
Trade Programs
None applicable