Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof › For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)
| Heading/Sub | Stat Suffix | Article Description | Unit of Qty | General | Special | Column 2 |
|---|---|---|---|---|---|---|
| 90.31 | Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: | — | — | — | ||
| ..4 |
1 code under 9031.41