9031.41.00.20

HTS 10

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof › For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) › For inspecting photomasks or reticles used in manufacturing semiconductor devices

Classification

Heading/Sub Stat Suffix Article Description Unit of Qty General Special Column 2
90.31Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:———
..4
..4.1.For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)Free—50%
20For inspecting photomasks or reticles used in manufacturing semiconductor devices———
Governing Provision
9031.41.00

For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits)

Governed by 9031.41.00 (inherited_rate_bearing_ancestor)

Additional Duties & Quota
Additional Duties
None
Quota
None
Trade Programs

None applicable

HTS 9031.41.00.20 — Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof › For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) › For inspecting photomasks or reticles used in manufacturing semiconductor devices | RefundArrow | RefundArrow