9031.49.70

HTS 8

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof › Other › For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices

Classification

Heading/Sub Stat Suffix Article Description Unit of Qty General Special Column 2
90.31Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:———
..4Other:———
..4.9.

HTS 10 Codes

1 code under 9031.49.70

9031.49.70.00
HTS 10

For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices