9031.80.40

HTS 8

Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof › Other instruments, appliances and machines › Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles

Classification

Heading/Sub Stat Suffix Article Description Unit of Qty General Special Column 2
90.31Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof:———
..8Other instruments, appliances and machines:———
..8.0.

HTS 10 Codes

1 code under 9031.80.40

9031.80.40.00
HTS 10

Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles